Microscopy Applied to Materials Chemistry [SCHIM121]
- 4 credits
- 12h
- 2nd quarter
Language of instruction: EnglishTeacher: Aprile Carmela
Learning outcomes
This course will provide the theoretical basis and knowledge of the current applications of the most important microscopy techniques for the characterization of materials.
Objectives
The aim of the course is to give to the student an overview of characterization techniques based on the use of optical and electron microscopy as well as atomic force microscopy. The applications of these techniques to the field of materials chemistry are highlighted via the use of examples coming from the recent literature.
Content
see table of contents
Table of contents
1. Introduction 2. Microscopy. Why is it important? 3. Different Microscopic techniques: Transmission Electron Microscopy (TEM) 4. Scanning Electron Microscopy (SEM) 5. Atomic Force Microscopy (AFM) 6. Scanning Tunneling Microscopy (STM) 7. Some Advanced techniques
Teaching methods
Lectures, using a PowerPoint presentation as support (the pdf version of all the presentations is available on webcampus).
Evaluations
Oral exam (discussion) based on an actual example taken from literature. To validate the EU, the student should also prepare a short written work.
To validate the credits of the teaching unit, the student must obtain an average mark of at least 10/20.
The average for the teaching unit is calculated as follows: oral exam (70%), work (30%).
Language of instruction
EnglishLocation for course
NAMUROrganizer
Faculté des sciencesRue de Bruxelles, 61
5000 NAMUR
